This text reviews the current state of all types of electromagnetic testing techniques and considers the implications of innovations for future inspection practice. Topics covered include: inversion; imaging and flaw reconstruction; advanced signal processing; artificial intelligence and neural networks; modelling; simulation and benchmark problems; reliability of inspections; new techniques and novel sensors; and automation of data acquisition and processing.
Product Details
- Series: Studies in Applied Electromagnetics and Mechanics , Vol 8
- Hardcover: 360 pages
- Publisher: Ios Pr Inc (January 1, 1995)
- Language: English
- ISBN-10: 9051992394
- ISBN-13: 978-9051992397
- Product Dimensions: 9.7 x 6.4 x 1 inches
- Shipping Weight: 1.7 pounds
Hardcover: $ 192.40
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